Home » Dynacolor 0.3MP, 136fps, SWIR TEC IMX991 GigE Camera

Dynacolor 0.3MP, 136fps, SWIR TEC IMX991 GigE Camera

$9,400.00

The 0.3MP Dynacolor FE-W4-M (mono and SWIR) PoE GigE camera features a Sony IMX991 sensor and delivers 136fps performance. Its thermoelectric cooling (TEC) significantly improves image quality by precisely controlling the sensor temperature. A 27-month warranty ensures your investment. It is also US import tariff-friendly.

Brand: Dynacolor
Manufacturer: Dynacolor
Megapixel: 0.3
Frame Rate (fps): 136
Interface: 1GigE, 6-pin Hirose
Sensor Size (in): 1/4
Sensor Type: CMOS
Sensor Model: Sony IMX991
Resolution: 640x512
Pixel Size (µm): 5
Shutter: Global
I/O Port: 6-pin Hirose
Power Options: PoE, 6-pin Hirose
Spectrum: Monochrome, SWIR
Lens Mount: C-Mount
SKU: FE-W4-M Categories: , , Tag:

Dynacolor SWIR TEC IMX991 GigE Camera

The FE-W4-M is a cutting-edge GigE Vision camera that captures both short-wave infrared (SWIR) and visible light, providing unique imaging capabilities for a variety of applications. SWIR imaging allows you to see through certain materials (like silicon), detect hidden objects, and enhance contrast in ways visible light cannot. This, combined with the camera’s visible light capabilities, opens up a world of possibilities for industrial inspection, scientific research, and more.

This camera also features thermoelectric cooling (TEC), which significantly benefits image quality, especially during long exposures or in high-temperature environments. By precisely controlling the sensor temperature, TEC cooling minimizes dark current noise, resulting in cleaner, sharper images with improved contrast and accuracy. This makes the FE-W4-M ideal for demanding applications where image quality is paramount.

Key Features

  • US import tariff-friendly
  • Designed and manufactured in Taiwan
  • Senses both SWIR and visible light (400nm to 1700nm)
  • Thermoelectric cooling (TEC)
  • Extensive firmware features
  • External and software triggering
  • Triggering with minimal latency and jitter
  • Precise clock synchronization
  • Onboard frame buffer
  • Gigabit Ethernet interface, providing 1Gbps of bandwidth with a maximum transmission distance of 100m
  • Supports PoE power supply and 6-pin Hirose connector
  • Dimensions: 58mm x 44mm x 62mm
  • Conforms to GigE Vision protocol and the GenICam standard
  • Conforms to CE and FCC standards
  • Easy integration via API library

Industry Applications Include

  • Quality control: Detecting defects in silicon, glass, and metals
  • Food inspection: Identifying foreign objects, bruises, or water content in food products
  • Pharmaceutical inspection: Verifying packaging integrity and detecting contaminants
  • Semiconductor Inspection: Analyzing wafer defects and inspecting integrated circuits
  • Agriculture: Monitoring crop health, detecting water stress, analyzing fruit ripeness

Application Examples

Food Inspection

SWIR technology revolutionizes food safety by detecting contaminants and defects invisible to the naked eye. While traditional visual inspections are limited, SWIR imaging can effectively identify eggshell fragments, ensuring food safety and enhancing product value.SWIR Technology Food Inspection

Product Sorting

SWIR imaging reveals hidden moisture content in apples. By detecting water absorption, SWIR technology enables accurate quality grading and sorting of fruits and vegetables, ensuring freshness and optimizing product selection.SWIR Technology Product Sorting

Material Inspection

SWIR imaging differentiates materials indistinguishable by visible light. In this example, SWIR clearly distinguishes the plastic pieces from the rocks, highlighting its potential for foreign object detection and material sorting in various industries.SWIR Technology Material Inspection

Semiconductor Inspection

SWIR imaging sees through silicon. In this example, SWIR light penetrates multiple layers of silicon wafers to reveal hidden text, demonstrating its ability to detect defects and ensure precise alignment in semiconductor manufacturing.SWIR Technology Semiconductor Inspection

Temperature Estimation

SWIR imaging reveals invisible temperature variations. While visible light shows no change in the heated soldering iron, the SWIR image detects the increase in temperature, enabling applications like weld inspection and thermal analysis.SWIR Technology Temperature Estimation

Documents and Downloads

Notes

  • Actual cameras may differ from these images. Please see the datasheet for the exact dimensions.