Home » CREVIS 1.3MP, 134fps, SWIR TEC IMX990 CoaXPress Camera
CREVIS 55x55x74mm SWIR Camera Right Side 45 Degree
CREVIS 55x55x74mm SWIR Camera Left Side 45 Degree

CREVIS 1.3MP, 134fps, SWIR TEC IMX990 CoaXPress Camera

$10,000.00

The 1.3MP CREVIS HX-A130SW CoaXPress camera features a Sony SWIR TEC IMX990 sensor and delivers 134 fps performance. Designed and manufactured in South Korea, it includes a 3-year warranty to protect your investment. US import tariff-friendly.

Brand: CREVIS
Manufacturer: CREVIS
Megapixel: 1.3
Frame Rate (fps): 134
Interface: 12-pin Hirose, CoaXPress
Sensor Size (in): 1/2
Sensor Type: InGaAs
Sensor Model: Sony IMX990
Resolution: 1296x1032
Pixel Size (µm): 5
Shutter: Global
I/O Port: 12-pin Hirose
Power Options: PoCXP, 12-pin Hirose
Spectrum: Monochrome, SWIR
Lens Mount: C-Mount
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SKU: HX-A130SW Categories: , , Tag: Brand:

Features of the CREVIS SWIR TEC IMX990 CoaXPress Camera

  • Visible + SWIR wideband sensor capable of 0.4um to 1.7um
  • Removable 900nm long pass filter included to limit light to 0.9um to 1.7um (the SWIR spectrum)
  • Built-in thermoelectric cooler (Performance-guaranteed temperature of +15℃)
  • Easy integration via an API library
  • Extensive firmware features
  • External and software triggering
  • CoaXPress CXP-12 / Micro-BNC interface providing 12.5 Gbps of bandwidth up to a distance of 35m
  • Dimensions: 55mm x 55mm x 74mm
  • Conforms to the GenICam standard
  • Conforms to CE and FCC standards
  • Designed and manufactured in South Korea
  • US import tariff-friendly

Industry Applications Include

  • Quality control: Detecting defects in silicon, glass, and metals
  • Food inspection: Identifying foreign objects, bruises, or water content in food products
  • Pharmaceutical inspection: Verifying packaging integrity and detecting contaminants
  • Semiconductor Inspection: Analyzing wafer defects and inspecting integrated circuits
  • Agriculture: Monitoring crop health, detecting water stress, analyzing fruit ripeness

Application Examples

Material Differentiation

SWIR imaging spots differences between materials that appear identical in visible light by reading their unique SWIR absorption and reflection characteristics, offering enhanced material differentiation for quality control and inspection tasks.

Material See-Through Inspection

SWIR cameras enable non-contact inspection through materials like silicone, wafers, plastics, fog, and inks, allowing users to safely perform delicate factory inspections.

Moisture Detection

Moisture strongly absorbs SWIR light and appears very dark in SWIR images, enabling reliable, high-speed detection.

Documents and Downloads

Notes

  • Actual cameras may differ from these images. Please see the catalog for the exact dimensions.

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