CREVIS 1.3MP, 134fps, SWIR TEC IMX990 Camera Link Camera

Features of the CREVIS SWIR TEC IMX990 Camera Link Camera

• Visible + SWIR wideband sensor (0.4um to 1.7um)
• Built-in thermoelectric cooler (Performance-guaranteed temperature of +15℃)
• Easy integration via an API library
• Extensive firmware features
• External and software triggering
• Dimensions: 55mm x 55mm x 74mm
• Conforms to CE and FCC standards
• Designed and manufactured in South Korea
• US import tariff-friendly

Industry Applications Include

• Quality control: Detecting defects in silicon, glass, and metals
• Food inspection: Identifying foreign objects, bruises, or water content in food products
• Pharmaceutical inspection: Verifying packaging integrity and detecting contaminants
• Semiconductor Inspection: Analyzing wafer defects and inspecting integrated circuits
• Agriculture: Monitoring crop health, detecting water stress, analyzing fruit ripeness

Application Examples

Material Differentiation

SWIR imaging distinguishes between materials that appear identical in visible light by reading their unique SWIR absorption and reflection characteristics, offering enhanced material differentiation for quality control and inspection tasks.

Material Penetration Inspection

SWIR cameras enable non-contact inspection through materials like silicone, wafers, plastics, fog, and inks, empowering users to perform delicate inspections safely and effectively.

Moisture Detection

Moisture strongly absorbs SWIR wavelengths and appears dark in SWIR images, enabling reliable detection.

Documents and Downloads

• CREVIS manuals
• CREVIS GitHub software repository
• CREVIS InGaAs SWIR cameras STP file
• CREVIS InGaAs SWIR cameras DWG and PDF drawing files
• CREVIS SWIR Camera Catalog 2026
• CREVIS Machine Vision Camera Catalog

Notes

• Actual cameras may differ from these images. Please see the catalog for the exact dimensions.