Home » CREVIS 1.3MP, 72fps, SWIR TEC IMX990 PoE GigE Camera

CREVIS 1.3MP, 72fps, SWIR TEC IMX990 PoE GigE Camera

$10,000.00

The 1.3MP CREVIS HG-A130SW PoE GigE camera features a Sony SWIR TEC IMX990 sensor and delivers 72 fps performance. Designed and manufactured in South Korea, it includes a 3-year warranty to protect your investment. US import tariff-friendly.

Brand: CREVIS
Manufacturer: CREVIS
Megapixel: 1.3
Frame Rate (fps): 72
Interface: 1GigE, 12-pin Hirose
Sensor Size (in): 1/2
Sensor Type: InGaAs
Sensor Model: Sony IMX990
Resolution: 1296x1032
Pixel Size (µm): 5
Shutter: Global
I/O Port: 12-pin Hirose
Power Options: PoE, 12-pin Hirose
Spectrum: Monochrome, SWIR
Lens Mount: C-Mount
SKU: HG-A130SW Categories: , , Tag: Brand:

Features of the CREVIS SWIR TEC IMX990 PoE GigE Camera

  • Visible + SWIR wideband sensor capable of 0.4um to 1.7um
  • Removable 900nm long pass filter included to limit light to 0.9um to 1.7um (the SWIR spectrum)
  • Built-in thermoelectric cooler (Performance-guaranteed temperature of +15℃)
  • Easy integration via an API library
  • Extensive firmware features
  • External and software triggering
  • Gigabit Ethernet interface providing 1Gbps of bandwidth with a maximum transmission distance of 100m
  • Supports PoE power supply and a 12-pin Hirose connector
  • Dimensions: 55mm x 55mm x 74mm
  • Conforms to GigE Vision protocol and the GenICam standard
  • Conforms to CE and FCC standards
  • Designed and manufactured in South Korea
  • US import tariff-friendly

Industry Applications Include

  • Quality control: Detecting defects in silicon, glass, and metals
  • Food inspection: Identifying foreign objects, bruises, or water content in food products
  • Pharmaceutical inspection: Verifying packaging integrity and detecting contaminants
  • Semiconductor Inspection: Analyzing wafer defects and inspecting integrated circuits
  • Agriculture: Monitoring crop health, detecting water stress, analyzing fruit ripeness

Application Examples

Material Differentiation

SWIR imaging spots differences between materials that appear identical in visible light by reading their unique SWIR absorption and reflection characteristics, offering enhanced material differentiation for quality control and inspection tasks.

Material See-Through Inspection

SWIR cameras enable non-contact inspection through materials like silicone, wafers, plastics, fog, and inks, allowing users to safely perform delicate factory inspections.

Moisture Detection

Moisture strongly absorbs SWIR light and appears very dark in SWIR images, enabling reliable, high-speed detection.

CREVIS SWIR Demo Kit

Evaluate the HG-A130SW in your own facility with the CREVIS SWIR Demo Kit. Available for free demo testing in the US or for direct purchase, this ready-to-use package provides everything you need to immediately test SWIR imaging for your specific inspection applications.

The kit is a compact, all-in-one setup designed for fast, plug-and-play testing on the factory floor or in the lab. It includes:

  • CREVIS HG-A130SW Camera: The basic kit features the exact 1.3MP InGaAs SWIR camera detailed above.
  • Varifocal SWIR Lens: Includes your choice of a 5–12.5mm or 12–25mm focal length lens.
  • SWIR Ring Light: A dedicated 1380nm wavelength ring light designed for optimal SWIR illumination.
  • System Controller: A compact, Linux-based Raspberry Pi controller that acts as a power source, lighting controller, and viewer program.
  • Accessories & Case: Includes all necessary camera cables securely packaged in a durable, portable case for easy transport.

Contact us today to request a free trial period or to purchase a dedicated testing kit for your facility.

Documents and Downloads

Notes

  • Actual cameras may differ from these images. Please see the catalog for the exact dimensions.